tracking
The Microwave Journal Channel
Sign In | Support

Garret Lees talks about Keysight’s industry first NB-IoT device test solution

Garret Lees, senior director of Keysight's Operator and Test Lab Solutions group, talks about Keysight’s industry first NB-IoT device test solution that measures KPIs like battery drain and coverage by simulating the real world in the lab using the Keysight UXM.
Rate this Video
View top rated
Comments (0)
Add your comment
Advertisement