Load pull characterization, which is of course a method of applying impedances to an RF device and measuring its performance, has been used for decades by high power RF designers. Recent advances in data file formats by load pull measurement system vendors, such as Maury Microwave and Focus Microwaves, have significantly expanded the usefulness of load pull characterization. These new file formats support a sweep of an independent variable, such as input power, DC bias, or temperature, in addition to the swept source or load impedances.
In this presentation, we show how new load pull file formats are integrated into Microwave Office and do so by illustrating an example design flow of a 2.1 GHz LDMOS power amplifier utilizing measured load pull data.
Prsented by: Chris Bean, Solutions Architect, AWR Group, NI