Several applications, such as RF device and IC characterization on semi-insulating semiconductors, often rely on the in-situ TRL calibration. In such cases, accurate measurement of the characteristic impedance Z0 of custom calibration transmission lines is a cumbersome but unavoidable and time-consuming step. This presentation will demonstrate how Cascade Microtech WinCal XE calibration software supports NIST-style multiline TRL calibration for custom standards and how it simplifies measurement of the line Z0.
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