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Practical Techniques For Recognizing And Diagnosing Root Causes Of Poor Waferlevel S parameter Calib

This presentation will demonstrate techniques for answering the toughest but most common diagnostic question; "Is my VNA calibration acceptable?" You will learn techniques to use the Cascade Microtech WinCal XE™ software to recognize common causes of poor RF probe tip calibrations and how to fix any problems that are discovered.

http://www.cascademicrotech.com
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