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Wafer-level Measurement Solution for Device Characterization up to 110 GHz

Gavin Fisher & Nancy Friedrich discuss the MeasureOne WMS system developed by Cascade Microtech and Agilent (now Keysight Technologies) at MTTS 2014. MeasureOne provides guaranteed configuration, installation and support in a pre-validated system configuration for accurate and repeatable wafer-level device characterization. This is essential for device modeling, technology development, process development and specification, process monitoring, component specification and pilot manufacturing.
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