This presentation introduces the latest advancements in RF device characterization through cutting-edge hardware and software solutions for source and load pull systems. Emphasizing the critical role of impedance control in optimizing nonlinear device performance, it explores both passive and active tuning techniques—including harmonic and hybrid approaches—for accurate and high-speed characterization of power amplifiers, LNAs, filters, and complex TX/RX modules. The presentation highlights Maury Microwave’s innovative hardware portfolio such as the MT2000 mixed-signal active load pull system, high-frequency Nano tuners, and sub-THz MMW Studio solutions. On the software side, it showcases InsightPro™, a next-generation measurement and modeling platform designed to streamline calibration, measurement, and data analysis workflows.
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