John Schultz, Ph.D., of Compass Technology Group describes how to use the new Epsilometer, a dielectric properties measurement device.

Epsilometer Dielectric Materials Measurement solution is a cost-effective, accessible way to measure material properties to enable and optimize RF system performance.

It measures dielectric substrate materials to determine the complex permittivity from 3 MHz up to 6 GHz and can accommodate sheet specimens 0.3 to 3 mm thick. The output includes dielectric permittivity, loss, and/or loss tangent as a function of frequency.

The Epsilometer solution includes R60 VNA with software, measurement fixture, Epsilometer software, and calibration sample.

Learn more here: https://coppermountaintech.com/vna/epsilometer-dielectric-materials-solution/