Microwave Journal Editors Pat Hindle and Eric Higham discuss the April Amplifiers and Oscillators issue technical articles, industry A&D and commercial news, and upcoming trade shows. Sponsored…
Microwave Journal editors Pat Hindle and Gary Lerude cover the August Trends in Test and Measure issue technical articles, industry news and IMS2020 virtual event. Sponsored by Wireless Telecom Group…
This video demonstrates how Qorvo determines reliability and thermal resistance for GaN devices. You can also refer to the GaN application note GaN Device Channel Temperature, Thermal Resistance, and…