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Interview with IEEE MTT-S IMS2020 Chair - Going Virtual!

Microwave Journal editor Pat Hindle talks with IEEE MTT-S IMS2020 general chair, Tim Lee, about the decision to make the event virtual and how that will work for the conference and exhibition.

From  Microwave Journal 0 likes 12 plays 0  

Vector Network Analyzer Measurement of S Parameters in a Pulsed RF System

Copper Mountain Technologies' Senior Design Engineer Brian Walker demonstrates how to make Pulsed S-parameter Measurements.

From  Microwave Journal 0 likes 5 plays 0