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Frequency Matters, March 8: Test/Meas Issue, AFR Demo, Industry News/Events

Microwave Journal editors Pat Hindle and Eric Higham review the articles in the March Test and Measurement themed issue, show automatic fixture removal software demo and review the latest industry…

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Frequency Matters Interview: Integra/Teledyne Discuss Game Changing 100V GaN Transistors

Microwave Journal editors Pat Hindle and Gary Lerude talk with Integra Technologies VP of Sales Marketing, Tom Kole, and Teledyne e2v VP of Business Development, Mont Taylor, about 100V GaN…

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New Developments in High Voltage RF GaN: Interview with Integra Tech

Oct 26, 2023Tom Kole, Vice President of Sales and Marketing at Integra Technologies, talks with Pat Hindle about the latest market trends in high power RF, new levels of high power being achieved by…

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Interview with Integra Tech: High Voltage GaN and Digitization

Tom Kole, Vice President of Sales and Marketing at Integra Technologies, talks with Pat Hindle, Media Director at Microwave Journal, about the significant improvements in SWAP-C from the use of high…

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