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Time Domain Reflectometry Measurements with a Vector Network Analyzer

Time Domain Reflectometry (TDR) has traditionally been performed using a fast oscilloscope and a very sharp impulse or step type excitation. Reflections from the excitation are measured at the source…

From  Microwave Journal 0 likes 4 plays 0  

Focus Beam Fundamentals

In this video, John Schultz, Chief Scientist at Compass Technology Group and material measurement expert, discusses how to measure the free space properties of materials using their Focus Beam System…

From  Microwave Journal 0 likes 4 plays 0  

What is a Smith Chart?

Brian Walker, Senior RF Design Engineer at Copper Mountain Technologies looks at how a Smith Chart is simply a special case of the polar plot and how the real and imaginary axes are constructed in…

From  Microwave Journal 0 likes 4 plays 0  

Epsilometer Principles of Operation

John Schultz, Ph.D., of Compass Technology Group describes the principles of how the new Epsilometer operates. Epsilometer Dielectric Materials Measurement solution is a cost-effective,…

From  Microwave Journal 0 likes 6 plays 0