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Time Domain Reflectometry (TDR) is an important method for measuring cable and connection quality for high-speed transmissions. This video shows how to use the advanced TDR mode with the Siglent…
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Maury Microwave walks through their 12 demo lab test/measurement stations at IMS 2023 in San Diego.
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Stan Oda, Product Marketing Manager at Mini-Circuits, demonstrates the eVNA that operates from 300 kHz to 6 GHz with a powerful software package that operates in the time domain with offline analysis…
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Dr Jonas Urbonas provides an overview of hybrid-active harmonic load pull measurements using a 4-port 4-source R&S ZNA, and an extension of the ZNA with large-signal time-domain analysis and EPHD…
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At EuMW 2021, Steve Dudkiewicz, Vice President, Marketing & Business Development, demonstrated the MMW-STUDIO active load pull solution in partnership with Vertigo Technologies.
MMW-STUDIO…
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At EuMW 2021, Steve Dudkiewicz, Vice President, Marketing & Business Development, demonstrated Maury's latest automated impedance tuner, the Nano5G.
The Nano5G is the industry's…
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IVCAD, the industry leading device characterization software platform brought to you by Maury Microwave and AMCAD Engineering, empowers powerful measurement automation without any software…
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Maury Applications Engineer, John Dominguez provides an introduction to active load pull and the MT2000 mixed-signal active load pull system. John then performs a comprehensive demonstration of the…
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Load Pull is the act of presenting a set of controlled impedances to a device under test (DUT) and measuring a set of parameters at each point. By varying the impedance, it is possible to fully…
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Vector receiver load pull, also referred to as real-time load pull, has become the preferred load pull methodology of the 2010s and 2020s. Vector receiver load pull replaces a traditional scalar…
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During the initial stages of device technology development, timely feedback to device development engineers is important to accelerate the development process. Quickly and accurately benchmarking…
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Performing device characterization measurements at millimeter-wave and sub-THz frequencies can be challenging for several reasons. First, it’s difficult to achieve accurate and repeatable…
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Subbaiah Pemmaiah of Copper Mountain demonstrates their new cost effective 44 GHz VNA by measuring a bandpass filter at IMS2021.
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Time Domain Reflectometry (TDR) has traditionally been performed using a fast oscilloscope and a very sharp impulse or step type excitation. Reflections from the excitation are measured at the source…
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In this video, Zander shows how to take a measurement using the C4220 VNA and CobaltFx frequency extenders and the Focus Beam System from Compass Technology Group and their CTGcalc software.
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Tekamul Buber, Senior Principal Engineer at Maury Microwave, discusses the measurement methods, calibration essentials, and load pull requirements for high-power mmW device characterization,…
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