Search for tag: "past"

Interview About ISL's RFView: New Advanced HIL RF Test System

Information Systems Laboratories' (ISL) President and CEO, Joe Guerci, talks with Microwave Journal Media Director, Pat Hindle, about RFView, a new advanced hardware-in-the-loop RF test system…

From  Microwave Journal 0 likes 15 plays 0  

Spectrum Control New Modular Product Platform

Spectrum Control introduces a new Open VPX, SOSA aligned modular product platform focusing on EW and other applications at IMS 2023 in San Diego.

From  Microwave Journal 0 likes 4 plays 0  

ADI Demonstrates its New Flagship Apollo MxFE Platform

Analog Devices introduces and demonstrates its new flagship Apollo MxFE platform, a 4T4R with 14/28 GSPS data rate, at IMS 2023 in San Diego. For more information, visit www.analog.com/mxfe.

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How Do You Achieve the Q Needed for Low Insertion Loss?

FAQ: How do you get the Q needed for low insertion loss?

From  Microwave Journal 0 likes 7 plays 0  

Interview About ISL's RFView: New Advanced HIL RF Test System

Information Systems Laboratories' (ISL) President and CEO, Joe Guerci, talks with Microwave Journal Media Director, Pat Hindle, about RFView, a new advanced hardware-in-the-loop RF test system…

From  Microwave Journal 0 likes 21 plays 0  

Top 10 Reasons for USB vs Traditional VNAs

In this video, our Regional Technical Sales Manager for the Midwest, Barry Myers reviews the benefits of using USB vector network analyzers rather than traditional, built-in PC VNAs.

From  Microwave Journal 0 likes 4 plays 0