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Interview About ISL's RFView: New Advanced HIL RF Test System

Information Systems Laboratories' (ISL) President and CEO, Joe Guerci, talks with Microwave Journal Media Director, Pat Hindle, about RFView, a new advanced hardware-in-the-loop RF test system…

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Frequency Matters Nov 4: 5G/6G & IoT issue, Altair Interview, Industry News/Events

Microwave Journal Editors Pat Hindle and Gary Lerude review the technical articles in the Nov 5G/6G and IoT themed issue, Interview Altair about electronics system design, and review recent industry…

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Times Microwave Systems- WPB-400 MN Demo

In this demonstration, Kevin Moyher demonstrates our new weather protection boot for LMR® 400, for an N male and LMR-400 cable. It is our WPB-400-NM product. Check out our WPB-400-NM here:…

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Times Microwave LMR EZ HC KIT Demo

In this video, Kevin Moyher demonstrates our new hard case Tool Kit for LMR® 195/200/240 EZ HC Kit. Check out our tool kit here: https://timesmicrowave.com/tools/tk-195-200-240ez-hc/ …

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IMS 2022 Demo: 100 kHz to 43.5 GHz Signal Analyzer from Signal Hound

Justin Crooks, Senior Engineer at Signal Hound, demonstrates the new signal analyzer operating from 100 kH to 43.5 GHz with 160 MHz I/O capture BW using their Spike software.

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IVCAD Custom Drivers

With IVCAD, the industry leading device characterization software platform brought to you by Maury Microwave and AMCAD Engineering, its a simple task for users to create custom instrument drivers. …

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Interview About ISL's RFView: New Advanced HIL RF Test System

Information Systems Laboratories' (ISL) President and CEO, Joe Guerci, talks with Microwave Journal Media Director, Pat Hindle, about RFView, a new advanced hardware-in-the-loop RF test system…

From  Microwave Journal 0 likes 21 plays 0  

RD5556SiC - 600V 3-phase Brushless DC Motor Control Reference Design

This video demonstrates how Qorvo’s PAC5556 (https://www.qorvo.com/products/p/PAC5556) and new UnitedSiC FETs (https://unitedsic.com/products/sic-fets/uf3c065030k3s/) align to create a highly…

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Learn About SnapEDA, The Google for Electronic Design Engineers

Microwave Journal/Signal Integrity Journal Editorial Director, Pat Hindle, talks with SnapEDA Founder and CEO, Natasha Baker, about the genesis of the company and how engineers can save time…

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RWW 21 - Measurement Uncertainty Analysis and PA Design with Uncertainty Added S-Parameters

Tekamul Buber, Senior Principal Engineer at Maury Microwave, discusses the motivation of using S-parameters with uncertainty, compares traditional and enhanced VNA measurement models, and finally…

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RF GaN Experience | Fab Tour

Visit NXP’s new GaN fab in Chandler. This manufacturing facility is the most advanced GaN Fab for RF in the U.S. Follow NXP's fab director Geno Fallico as he takes you on a tour. …

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