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Keysight demonstrates the new E5081A ENA-X VNA that comes in 20 and 44 GHz with 2 or 4 port options and can make many measurements such as S-parameters, gain compression, EVM, ACPR, spurious, NPR,…
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R&S demonstrates their VNA measurements of a 67 GHz amplifier including S-parameters, intermodulation, compression point and even noise figure at IMS 2023 in San Diego.
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Learn how MATLAB and Simulink can be used to design RF transceivers with integrated antenna array for wideband communication systems, radar, and smart location devices, where a combination of…
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Virginia Diodes demonstrates a 220 to 330 GHz noise figure measurement system using VDI down converters and noise source along with Keysight measurement units at EuMW 2022 in Milan.
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Amplitech CEO, Fawad Maqbool, talks with Microwave Journal Media Director, Pat Hindle, about their growth markets, new products and upcoming trade shows.
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Part of IIT Kanpur's 2021 short course on modeling and simulation of nano-transistors.
Dr. Zacharia Ouardirhi of AMCAD Engineering presents on theory and execution of compact transistor…
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S-parameters are a preferred method of characterizing a device at RF and microwave frequencies. This video examines the basics of S-parameters and the related VNA measurements.
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In this episode of Chalk Talk, EE Journal's Amelia Dalton chats with Bror Peterson of Qorvo about the issues designers face in RF design for 5G (https://www.qorvo.com/innovation/5g), and some…
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