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R&S demonstrates 2 scenarios for radar target simulation showing very close range and moving electronic targets at EuMW 2023 in Berlin.
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Thanks for visiting the IMS 2021 Virtual Conference!
We hope you enjoy Maury Microwave's presentation on Understanding Your True Device Performance by Including Measurement Uncertainty.
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This video covers some useful tips and tricks to better utilize the Copper Mountain Technologies vector network analyzer software from Co-Founder and CRO Alex Goloschokin. There are many ways to get…
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Tekamul Buber, Senior Principal Engineer at Maury Microwave, discusses the motivation of using S-parameters with uncertainty, compares traditional and enhanced VNA measurement models, and finally…
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Osman Ceylan, Senior Application Engineer at Maury Microwave, discusses the concepts behind the classical VNA measurement model and the evolution to an enhanced model that includes uncertainties,…
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Dr Jonas Urbonas provides an overview of synchronized pulsed IV and pulsed S-parameter measurements. He starts with explaining the motivation and customer challenges, proceeds to introduce a turnkey…
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This video shows how to extract a GaN FET transistor compact model from pulsed IV and pulsed S parameter measurements using IVCAD, and export the model in NI-AWR circuit simulato Microwave Office.
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Load pull measurements are used to validate a transistor compact model. An overview of load pull is presented, then model refinement is presented with different criteria.
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S-parameters are a preferred method of characterizing a device at RF and microwave frequencies. This video examines the basics of S-parameters and the related VNA measurements.
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De-embedding is the process of eliminating something from your measurement, such as a filter or fixture. When you de-embed you eliminate the effect of something you don’t need to measure so…
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