Search for tag: "transistor"

14 Media

Frequency Matters Interview: Integra/Teledyne… duration 10 minutes 19 seconds Frequency Matters Interview: Integra/Teledyne… Frequency Matters Interview: Integra/Teledyne Discuss Game Changing 100V GaN Transistors	Frequency Matters Interview: Integra/Teledyne Discuss Game Changing 100V GaN Transistors Microwave Journal editors Pat Hindle and Gary Lerude talk with Integra Technologies VP of Sales Marketing, Tom Kole, and Teledyne e2v VP of Business Development, Mont Taylor, about 100V GaN… gan teledyne e2v integra frequency matters power market volt device applications heat side requirements hill space things density transistor volts aspects defense partnership challenge replacement From Microwave Journal 0 likes 13 plays 0
Interview with Integra Tech: High Voltage GaN and… duration 5 minutes 55 seconds Interview with Integra Tech: High Voltage GaN and… Interview with Integra Tech: High Voltage GaN and Digitization	Interview with Integra Tech: High Voltage GaN and Digitization Tom Kole, Vice President of Sales and Marketing at Integra Technologies, talks with Pat Hindle, Media Director at Microwave Journal, about the significant improvements in SWAP-C from the use of high… power applications amplifier things level transistor customers voltage palette size systems radar gan reduction rack customer complexity powers defense From Microwave Journal 0 likes 15 plays 0
Frequency Matters, April 21: Amp/Oscillator… duration 7 minutes 3 seconds Frequency Matters, April 21: Amp/Oscillator… Frequency Matters, April 21: Amp/Oscillator Products, Interview with Integra, News/Events	Frequency Matters, April 21: Amp/Oscillator Products, Interview with Integra, News/Events Microwave Journal editors Pat Hindle and Eric Higham cover the April Amplifier and Oscillator issue products, interview Tom Kole (VP of Sales and Marketing at Integra Tech) about high voltage GaN,… power technologies 16th communications industry president update microwave event events networks solutions ave refresh rfmw emerson transistor network gigahertz From Microwave Journal 0 likes 13 plays 0
Hybrid-Active Harmonic Load Pull, Large Signal… duration 7 minutes 46 seconds Hybrid-Active Harmonic Load Pull, Large Signal… Hybrid-Active Harmonic Load Pull, Large Signal Analysis and EPHD Behavioral Modeling with R&S ZNA	Hybrid-Active Harmonic Load Pull, Large Signal Analysis and EPHD Behavioral Modeling with R&S ZNA Dr Jonas Urbonas provides an overview of hybrid-active harmonic load pull measurements using a 4-port 4-source R&S ZNA, and an extension of the ZNA with large-signal time-domain analysis and EPHD… device measurement impedance load impedances frequency signal power termination measurements characterization model test reference analysis vector frequencies chart transistor From Microwave Journal 0 likes 52 plays 0
High Power Transistor Market Trends and New… duration 7 minutes 13 seconds High Power Transistor Market Trends and New… High Power Transistor Market Trends and New Innovative Modular Solution from Integra Technologies	High Power Transistor Market Trends and New Innovative Modular Solution from Integra Technologies Integra Technologies VP of Sales and Marketing talks with Microwave Journal Editors Pat Hindle and Gary Lerude about the high power transistor market and their new innovative modular solution that… power trends palette transistor solution volt voltage market parts band levels powers palettes transistors solutions approach technologies matters jamming tube From Microwave Journal 0 likes 6 plays 0
RWW 21 - Measurement Uncertainty Analysis and PA… duration 16 minutes 0 seconds RWW 21 - Measurement Uncertainty Analysis and PA… RWW 21 - Measurement Uncertainty Analysis and PA Design with Uncertainty Added S-Parameters	RWW 21 - Measurement Uncertainty Analysis and PA Design with Uncertainty Added S-Parameters Tekamul Buber, Senior Principal Engineer at Maury Microwave, discusses the motivation of using S-parameters with uncertainty, compares traditional and enhanced VNA measurement models, and finally… measurement uncertainties parameters vna measurements amplifier transistor calibration errors parameter uncertainty model tools networks error cable connector standards matching characterization From Microwave Journal 0 likes 5 plays 0
EuMW 20 - Fundamentals of Large Signal… duration 33 minutes 32 seconds EuMW 20 - Fundamentals of Large Signal… EuMW 20 - Fundamentals of Large Signal Characterization and High Power Amplifier Design	EuMW 20 - Fundamentals of Large Signal Characterization and High Power Amplifier Design Osman Ceylan, Senior Application Engineer at Maury Microwave, discusses large signal operation including high-efficiency requirements in today's device technologies as well as the fundamentals… measurement power impedance load measurements efficiency lot uncertainty pool amplifier output transistor calibration tuner source performance signal band configuration From Microwave Journal 0 likes 4 plays 0
EuMW 20 - Modeling of High-Power RF Transistors… duration 30 minutes 10 seconds EuMW 20 - Modeling of High-Power RF Transistors… EuMW 20 - Modeling of High-Power RF Transistors and Applications	EuMW 20 - Modeling of High-Power RF Transistors and Applications Mitra Gilasgar, Principle Design Engineer at Ampleon, introduces a modeling flow used to model high-power RF transistors. Mitra starts with power amplifier basics, an introduction to LDMOS… model power measurement device transistor load fixture impedance point efficiency simulation pool application transistors input ruggedness band tuner wire From Microwave Journal 0 likes 4 plays 0
How to improve measurement reliability -… duration 9 minutes 54 seconds How to improve measurement reliability -… How to improve measurement reliability - oscillations	How to improve measurement reliability - oscillations Dr Osman Ceylan presents on the primary sources of oscillations during measurements and simple yet effective solutions to prevent oscillations caused by measurement systems measurement power feedback oscillation package transistor oscillations signal input source duty output presentation measurements frequency sources band networks device recommendations From Microwave Journal 0 likes 4 plays 0
How to improve measurement reliability -… duration 7 minutes 24 seconds How to improve measurement reliability -… How to improve measurement reliability - low-frequency stability	How to improve measurement reliability - low-frequency stability John Dominguez presents on the low-frequency analysis of PAs, and practical solutions to overcome low-frequency oscillations caused by measurement systems input network frequency impedance output resistor region measurement capacitors range biasing transistor bias capacitor analysis values amplifier capacitance presentation bank From Microwave Journal 0 likes 4 plays 0
High-power high-gamma on-wafer hybrid-active… duration 5 minutes 41 seconds High-power high-gamma on-wafer hybrid-active… High-power high-gamma on-wafer hybrid-active waveguide vector receiver load pull	High-power high-gamma on-wafer hybrid-active waveguide vector receiver load pull Dr Jonas Urbonas provides an overview of high-power high-gamma on-wafer hybrid-active waveguide vector receiver load pull at mmW frequencies (50-110 GHz). He starts with explaining the… device power vector load measurement characterization gigahertz measurements impedance pool signal wave loss conditions operating transistor control vna parameters test From Microwave Journal 0 likes 5 plays 0
Synchronized Pulsed IV and Pulsed S-Parameters… duration 5 minutes 7 seconds Synchronized Pulsed IV and Pulsed S-Parameters… Synchronized Pulsed IV and Pulsed S-Parameters with Maury, AMCAD and Keysight	Synchronized Pulsed IV and Pulsed S-Parameters with Maury, AMCAD and Keysight Dr Jonas Urbonas provides an overview of synchronized pulsed IV and pulsed S-parameter measurements. He starts with explaining the motivation and customer challenges, proceeds to introduce a turnkey… measurements pulse transistor bias performance device measurement dciv drain models droop conditions volts -25 operating transistors parameter resolution bit amps From Microwave Journal 0 likes 3 plays 0
Active load pull measurements at mmW frequencies… duration 4 minutes 42 seconds Active load pull measurements at mmW frequencies… Active load pull measurements at mmW frequencies using IVCAD and PNA-X	Active load pull measurements at mmW frequencies using IVCAD and PNA-X Dr Jonas Urbonas provides an overview of VNA-based active load pull at mmW frequencies. He starts with explaining the motivation and customer challenges, proceeds to introduce a turnkey solution to… device pool test characterization impedance load measurement power intermodulation measurements lopool conditions gigahertz operating signal models transistor bias pattern systems From Microwave Journal 0 likes 4 plays 0
What Differentiates Integra RF Power Devices -… duration 8 minutes 5 seconds What Differentiates Integra RF Power Devices -… What Differentiates Integra RF Power Devices - Interview with MWJ	What Differentiates Integra RF Power Devices - Interview with MWJ Microwave Journal editors Pat Hindle and Gary Lerude talk with Tom Kole, Vice President of Sales and Marketing, and Apet Barsegyan, Vice President, Chief Operating Officer, at Integra RF Power… integra power palette level market palettes customers levels transistor transistors president vice trend custom differentiator solutions circuitry gate stage trends From Microwave Journal 0 likes 6 plays 0